Dimitris Nikolos: search on Z-Library

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1

On the design of low power BIST for multipliers with Booth encoding and Wallace tree summation

Dimitris Bakalis, Emmanouil Kalligeros, Dimitris Nikolos, Haridimos T. Vergos, George Alexiou

Journal:

Journal of Systems Architecture

Year:

2002

Language:

english

File:

PDF, 227 KB

english, 2002

2

[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden, Germany (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A novel fault tolerant cache architecture based on orthogonal latin squares theory

Filippou, Filippos, Keramidas, Georgios, Mavropoulos, Michail, Nikolos, Dimitris

Year:

2018

Language:

english

File:

PDF, 375 KB

english, 2018

3

Testing CMOS combinational iterative logic arrays for realistic faults

Dimitris Gizopoulos, Dimitris Nikolos, Antonis Paschalis

Journal:

Integration, the VLSI Journal

Year:

1996

Language:

english

File:

PDF, 1.11 MB

english, 1996

4

[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Recovery of performance degradation in defective branch target buffers

Filippou, Filippos, Keramidas, Georgios, Mavropoulos, Michail, Nikolos, Dimitris

Year:

2016

Language:

english

File:

PDF, 644 KB

english, 2016

5

On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST

Emmanouil Kalligeros, Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 299 KB

english, 2002

6

[IEEE 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Abu Dhabi, United Arab Emirates (2013.12.8-2013.12.11)] 2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS) - Enhancing dictionary based test data compression using the ATE repeat instruction

Sismanoglou, Panagiotis, Nikolos, Dimitris

Year:

2013

Language:

english

File:

PDF, 431 KB

english, 2013

7

[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Conditional soft-edge flip-flop for SET mitigation

Sismanoglou, Panagiotis, Nikolos, Dimitris

Year:

2016

Language:

english

File:

PDF, 522 KB

english, 2016

8

[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Test data compression based on reuse and bit-flipping of parts of dictionary entries

Sismanoglou, Panagiotis, Nikolos, Dimitris

Year:

2014

Language:

english

File:

PDF, 367 KB

english, 2014

9

[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - A Defect-Aware Reconfigurable Cache Architecture for Low-Vccmin DVFS-Enabled Systems

Mavropoulos, Michail, Keramidas, Georgios, Nikolos, Dimitris

Year:

2015

Language:

english

File:

PDF, 210 KB

english, 2015

10

Low-Power Leading-Zero Counting and Anticipation Logic for High-Speed Floating Point Units

Dimitrakopoulos, Giorgos, Galanopoulos, Kostas, Mavrokefalidis, Christos, Nikolos, Dimitris

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2008

Language:

english

File:

PDF, 995 KB

english, 2008

11

[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Preemptive built-in self-test for in-field structural testing

Sismanoglou, Panagiotis, Pitsios, Vlasis, Nikolos, Dimitris

Year:

2015

Language:

english

File:

PDF, 573 KB

english, 2015

12

Handling zero in diminished-one modulo 2 n + 1 adders

Efstathiou, Constantinos, Vergos, Haridimos T., Nikolos, Dimitris

Journal:

International Journal of Electronics

Year:

2003

Language:

english

File:

PDF, 184 KB

english, 2003

13

Guest Editorial

Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 26 KB

english, 2002

14

Testable Designs of Multiple Precharged Domino Circuits

Haniotakis, Themistoklis, Tsiatouhas, Yiorgos, Nikolos, Dimitris, Efstathiou, Constantine

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2007

Language:

english

File:

PDF, 161 KB

english, 2007

15

[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Low capture power dictionary-based test data compression

Sismanoglou, Panagiotis, Nikolos, Dimitris

Year:

2016

Language:

english

File:

PDF, 340 KB

english, 2016

16

Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains

Kavousianos, Xrysovalantis, Kalligeros, Emmanouil, Nikolos, Dimitris

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2008

Language:

english

File:

PDF, 433 KB

english, 2008

17

Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores

Kavousianos, Xrysovalantis, Kalligeros, Emmanouil, Nikolos, Dimitris

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2007

Language:

english

File:

PDF, 539 KB

english, 2007

18

On robust two-pattern testing of one-dimensional CMOS iterative logic arrays

GIZOPOULOS, DIMITRIS, PASCHALIS, ANTONIS, NIKOLOS, DIMITRIS, HALATSIS, CONSTANTINE

Journal:

International Journal of Electronics

Year:

1999

Language:

english

File:

PDF, 190 KB

english, 1999

19

[ACM Press the 25th edition - Pittsburgh, Pennsylvania, USA (2015.05.20-2015.05.22)] Proceedings of the 25th edition on Great Lakes Symposium on VLSI - GLSVLSI '15 - Reconfigurable

Mavropoulos, Michail, Keramidas, Georgios, Adamopoulos, Grigorios, Nikolos, Dimitris

Year:

2015

Language:

english

File:

PDF, 666 KB

english, 2015

20

Self-Testing Embedded Two-Rail Checkers

Dimitris Nikolos

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 142 KB

english, 1998

21

[IEEE IEEE 17th International Conference on Application-specific Systems, Architectures and Processors (ASAP'06) - Steamboat Springs, CO (2006.09.11-2006.09.13)] IEEE 17th International Conference on Application-specific Systems, Architectures and Processors (ASAP'06) - An Energy-Delay Efficient Subword Permutation Unit

Dimitrakopoulos, Giorgos, Mavrokefalidis, Christos, Galanopoulos, Costas, Nikolos, Dimitris

Year:

2006

Language:

english

File:

PDF, 179 KB

english, 2006

22

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Spatial pattern prediction based management of faulty data caches

Keramidas, Georgios, Mavropoulos, Michail, Karvouniari, Anna, Nikolos, Dimitris

Year:

2014

Language:

english

File:

PDF, 377 KB

english, 2014

23

Efficient partial scan cell gating for low-power scan-based testing

Kavousianos, Xrysovalantis, Bakalis, Dimitris, Nikolos, Dimitris

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2009

Language:

english

File:

PDF, 275 KB

english, 2009

24

C-Testable modified-Booth multipliers

Dimitris Gizopoulos, Dimitris Nikolos, Antonis Paschalis, Constantin Halatsis

Journal:

Journal of Electronic Testing

Year:

1996

Language:

english

File:

PDF, 1.36 MB

english, 1996

25

Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches

Sismanoglou, Panagiotis, Nikolos, Dimitris

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 17.17 MB

english, 2013

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